{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T05:10:25Z","timestamp":1783573825950,"version":"3.55.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1834203"],"award-info":[{"award-number":["U1834203"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Sichuan Science and Technology Program","award":["2020JDTD0009"],"award-info":[{"award-number":["2020JDTD0009"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tie.2021.3116545","type":"journal-article","created":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T02:19:50Z","timestamp":1633486790000},"page":"9440-9450","source":"Crossref","is-referenced-by-count":20,"title":["Convenient Online Approach to Multisource Partial Discharge Localization in Transformer"],"prefix":"10.1109","volume":"69","author":[{"given":"Junyi","family":"Cai","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6070-0020","authenticated-orcid":false,"given":"Lijun","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yulin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4332-2862","authenticated-orcid":false,"given":"Dongyang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei","family":"Liao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chenqingyu","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959500"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336604"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777383"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3036252"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2872820"},{"key":"ref6","year":"2015","journal-title":"High-Voltage Test Techniques-Partial Discharge Measurements"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5092"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2016.0417"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/57.156943"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaf554"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2015.07.011"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2769159"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2799489"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab3fe4"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/09205071.2018.1456365"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2374182"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1755-1315\/440\/3\/032122"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s17020247"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/s18051410"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006398"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.7116363"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2921919"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775358"},{"issue":"5","key":"ref24","doi-asserted-by":"crossref","first-page":"4144","DOI":"10.1109\/TIE.2019.2921281","article-title":"Separation of sources from single-channel EEG signals using independent component analysis","volume":"67","author":"Ghosh","year":"2020","journal-title":"IEEE Trans. Ind. Electron."},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2468686"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSA.2005.851925"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4591242"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007293"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8871433"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2016.0417"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9749999\/09559757.pdf?arnumber=9559757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:26:49Z","timestamp":1705012009000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9559757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":30,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3116545","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}