{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T18:21:46Z","timestamp":1776277306875,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["E2021203162"],"award-info":[{"award-number":["E2021203162"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015286","name":"Hebei Provincial Key Research Projects","doi-asserted-by":"publisher","award":["19214405D"],"award-info":[{"award-number":["19214405D"]}],"id":[{"id":"10.13039\/501100015286","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51677162"],"award-info":[{"award-number":["51677162"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tie.2021.3121715","type":"journal-article","created":{"date-parts":[[2021,10,29]],"date-time":"2021-10-29T19:21:05Z","timestamp":1635535265000},"page":"11293-11303","source":"Crossref","is-referenced-by-count":22,"title":["Low-Frequency Voltage Ripples Decoupling With Switched-Capacitor Conversion for an MMC-Based SST"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7606-0702","authenticated-orcid":false,"given":"Zemin","family":"Bu","sequence":"first","affiliation":[{"name":"Electrical Engineering Institute, Yanshan University, Qinhuangdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8841-1124","authenticated-orcid":false,"given":"Jiaxun","family":"Teng","sequence":"additional","affiliation":[{"name":"Electrical Engineering Institute, Yanshan University, Qinhuangdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7127-6133","authenticated-orcid":false,"given":"Xiaofeng","family":"Sun","sequence":"additional","affiliation":[{"name":"Electrical Engineering Institute, Yanshan University, Qinhuangdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9127-831X","authenticated-orcid":false,"given":"Yuzhuo","family":"Pan","sequence":"additional","affiliation":[{"name":"Electrical Engineering Institute, Yanshan University, Qinhuangdao, China"}]},{"given":"Yao","family":"Pan","sequence":"additional","affiliation":[{"name":"Electrical Engineering Institute, Yanshan University, Qinhuangdao, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2016.2639820"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2081330"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2277917"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2738610"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SPEEDAM.2012.6264573"},{"issue":"7","key":"ref6","first-page":"3009","article-title":"Power electronic transformer for advanced grid management in presence of distributed generation","volume":"6","author":"Brando","year":"2011","journal-title":"Int. Rev. Elect. Eng."},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2209461"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2377719"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2923785"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2450756"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2864657"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2016.2611648"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8913097"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2019.8921513"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2015.7309404"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICPRE.2017.8390543"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC.2018.8590678"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/ICPE2019-ECCEAsia42246.2019.8797182"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC.2018.8590415"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2019.8781398"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/AEEES48850.2020.9121392"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2015.7281971"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.23919\/EPE17ECCEEurope.2017.8099160"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2007.4342371"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2006.889583"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2033926"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2010.5433418"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2014.6803442"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2378752"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2227818"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3012293"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2930810"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3006956"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2411858"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2997983"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT-Asia.2014.6873882"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2623679"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/b100747"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9789949\/09594654.pdf?arnumber=9594654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T00:38:10Z","timestamp":1705019890000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9594654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":38,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3121715","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}