{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T20:24:07Z","timestamp":1768422247303,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Sichuan Province Science and Technology Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tie.2021.3123642","type":"journal-article","created":{"date-parts":[[2021,11,3]],"date-time":"2021-11-03T19:25:22Z","timestamp":1635967522000},"page":"11458-11467","source":"Crossref","is-referenced-by-count":16,"title":["A Rate-Difference Disturbance Observer Control for a Timing-Belt Servo System"],"prefix":"10.1109","volume":"69","author":[{"given":"Zhiyong","family":"Yu","sequence":"first","affiliation":[{"name":"Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tao","family":"Yang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Ruan","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianrong","family":"Xu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5835-7892","authenticated-orcid":false,"given":"Tao","family":"Tang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2008.07.005"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICRAS.2019.8809077"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2721883"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2014.7048570"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8926953"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CGNCC.2016.7828965"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MOCAST.2018.8376636"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.906130"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2432103"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/SICE.2017.8105733"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2003.1267902"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1515\/comp-2018-0010"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VSS.2006.1644547"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.894719"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLC.2006.258385"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RISSP.2003.1285573"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.04.006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2903752"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1541\/ieejjia.4.514"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/CCC50068.2020.9189446"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC49329.2020.9164524"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/AIM.2017.8014058"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-017-9448-8"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912780"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2038398"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICMECH.2013.6519143"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2014.6942885"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICM46511.2021.9385638"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/s18030754"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/3516.828587"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-012-0175-3"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9789949\/09600581.pdf?arnumber=9600581","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:54:28Z","timestamp":1705017268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9600581\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":31,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3123642","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}