{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T07:38:53Z","timestamp":1768289933870,"version":"3.49.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51991381"],"award-info":[{"award-number":["51991381"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51825701"],"award-info":[{"award-number":["51825701"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008081","name":"Southeast University","doi-asserted-by":"publisher","award":["YBPY2147"],"award-info":[{"award-number":["YBPY2147"]}],"id":[{"id":"10.13039\/501100008081","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tie.2021.3130334","type":"journal-article","created":{"date-parts":[[2021,12,2]],"date-time":"2021-12-02T20:23:05Z","timestamp":1638476585000},"page":"12270-12280","source":"Crossref","is-referenced-by-count":20,"title":["Inductance Characteristics of Flux-Switching Permanent Magnet Machine Based on General Air-Gap Filed Modulation Theory"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5207-3514","authenticated-orcid":false,"given":"Peixin","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2047-9712","authenticated-orcid":false,"given":"Wei","family":"Hua","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2170-8820","authenticated-orcid":false,"given":"Gan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5951-0089","authenticated-orcid":false,"given":"Bo","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3466-234X","authenticated-orcid":false,"given":"Ming","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2210009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2610940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2016.0321"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2656178"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2286777"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2492940"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123853"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2875636"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2402201"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2611139"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3070504"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2279344"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2027570"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3068674"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2013244"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2461514"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2364716"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2900749"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3006189"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2203140"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3048404"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2886686"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2031901"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2921891"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2049812"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682792"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2842741"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9971147\/09633256.pdf?arnumber=9633256","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T23:07:25Z","timestamp":1710371245000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9633256\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":27,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3130334","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}