{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:00:09Z","timestamp":1762254009149,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51807152","52177193"],"award-info":[{"award-number":["51807152","52177193"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100011436","name":"State Key Laboratory of Electrical Insulation and Power Equipment","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100011436","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tie.2021.3131845","type":"journal-article","created":{"date-parts":[[2021,12,7]],"date-time":"2021-12-07T20:31:47Z","timestamp":1638909107000},"page":"12632-12640","source":"Crossref","is-referenced-by-count":4,"title":["Variable Switching Frequency Scheme Minimizing Inductor Saturation Margin for Totem-Pole Rectifier Based on Frequency-Domain Ripple Analysis"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4523-4260","authenticated-orcid":false,"given":"Jinshui","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0378-2194","authenticated-orcid":false,"given":"Yan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0050-2548","authenticated-orcid":false,"given":"Jinjun","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuan","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoyang","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2958709"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2933800"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2059046"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2716873"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3034851"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2990628"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2959736"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2420660"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2601165"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2886044"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2199951"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2408053"},{"article-title":"Soft Ferrites : Properties and Applications","volume-title":"2nd ed. Waltham, MA, USA: Butterworths","author":"Snelling","key":"ref13"},{"key":"ref14","article-title":"Modern Ferrite Technology","volume-title":"2nd ed","author":"Goldman","year":"2005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2009635"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7309876"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2967741"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2877650"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2089700"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2938474"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2777906"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2944853"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9971147\/09640592.pdf?arnumber=9640592","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T20:46:24Z","timestamp":1709325984000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9640592\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":22,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3131845","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}