{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T16:27:03Z","timestamp":1783096023273,"version":"3.54.6"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52025121"],"award-info":[{"award-number":["52025121"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975118"],"award-info":[{"award-number":["51975118"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52002066"],"award-info":[{"award-number":["52002066"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific and Technological in Jiangsu Province","award":["BA2020068"],"award-info":[{"award-number":["BA2020068"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tie.2021.3134072","type":"journal-article","created":{"date-parts":[[2021,12,21]],"date-time":"2021-12-21T20:50:09Z","timestamp":1640119809000},"page":"13337-13347","source":"Crossref","is-referenced-by-count":47,"title":["An Integrated Scheme for Coefficient Estimation of Tire\u2013Road Friction With Mass Parameter Mismatch Under Complex Driving Scenarios"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6965-0587","authenticated-orcid":false,"given":"Yan","family":"Wang","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6897-4512","authenticated-orcid":false,"given":"Chen","family":"Lv","sequence":"additional","affiliation":[{"name":"School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6398-5597","authenticated-orcid":false,"given":"Yongjun","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pai","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Faan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0410-917X","authenticated-orcid":false,"given":"Liwei","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8437-7598","authenticated-orcid":false,"given":"Guodong","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Friction Measurement Methods and the Correlation Between Road Friction and Traffic Safety: A Literature Review","author":"Wallman","year":"2001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/00423114.2012.659740"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2958308"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2939990"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844784"},{"issue":"11","key":"ref6","first-page":"21","article-title":"Detection of road surface conditions in winter using road surveillance cameras at daytime, night-time and twilight","volume":"14","author":"Shibata","year":"2014","journal-title":"Int. J. Comput. Sci. Netw. Secur."},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2013.09.011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00423114.2018.1475678"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1177\/0954407020929233"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(97)00003-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2159240"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2704606"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2494041"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s12239-016-0097-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2012.09.009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s12239-016-0044-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.07.024"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00423114.2019.1580377"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2875459"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2013.2260190"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/00423114.2014.918629"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.10.006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1177\/0954407015595725"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-019-04794-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1177\/1464419315573353"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.08.006"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2709326"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-013-0793-z"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2782236"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.trpro.2018.12.154"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9970766\/09658257.pdf?arnumber=9658257","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T00:05:19Z","timestamp":1704845119000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9658257\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":30,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3134072","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}