{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T15:57:45Z","timestamp":1774454265652,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,10]]},"DOI":"10.1109\/tie.2021.3137594","type":"journal-article","created":{"date-parts":[[2021,12,29]],"date-time":"2021-12-29T23:44:24Z","timestamp":1640821464000},"page":"9961-9971","source":"Crossref","is-referenced-by-count":18,"title":["A Gate Driving Strategy for the Series-Connected IGBTs to Improve the Resilience Against IGBTs Short-Circuit Failures"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0206-8570","authenticated-orcid":false,"given":"Sadegh","family":"Mohsenzade","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, K. N. Toosi University of Technology, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2006.879551"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2017.2683800"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2360189"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.854054"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3009606"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3061093"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2049272"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2016.2574126"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161336"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.857515"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2712705"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2633658"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2958357"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2017.2713781"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICPE.2011.5944531"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2894994"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/63.867682"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2007.4286526"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2711579"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699187"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.810661"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2702594"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2820700"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2020134"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2801848"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2990128"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3064288"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2153817"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL.2019.8769685"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9768205\/09665227.pdf?arnumber=9665227","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T21:38:00Z","timestamp":1705181880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9665227\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10]]},"references-count":29,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3137594","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,10]]}}}