{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T21:48:01Z","timestamp":1772488081881,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107181"],"award-info":[{"award-number":["52107181"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1866211"],"award-info":[{"award-number":["U1866211"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2021M690025"],"award-info":[{"award-number":["2021M690025"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tie.2021.3139140","type":"journal-article","created":{"date-parts":[[2022,1,6]],"date-time":"2022-01-06T20:28:54Z","timestamp":1641500934000},"page":"12575-12586","source":"Crossref","is-referenced-by-count":25,"title":["Current-Balance Mode-Based Unified Common-Mode Voltage Elimination Scheme for Dual Three-Phase Motor Drive System"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8051-2070","authenticated-orcid":false,"given":"Zewei","family":"Shen","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9986-0577","authenticated-orcid":false,"given":"Dong","family":"Jiang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8676-8322","authenticated-orcid":false,"given":"Jianxiao","family":"Zou","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2342-2340","authenticated-orcid":false,"given":"Zicheng","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"given":"Cuipeng","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918488"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa:20060342"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.811790"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2316361"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2752141"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2517819"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2454483"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748035"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/28.536872"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.911878"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/28.491472"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2170101"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2043541"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2036672"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2866338"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2499380"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/63.737591"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2633234"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2787733"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5692"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933446"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2248170"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2270219"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2299240"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2025419"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-33-4385-6"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2006.875469"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2820727"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9971147\/09673121.pdf?arnumber=9673121","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T22:48:53Z","timestamp":1705186133000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9673121\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":28,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3139140","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}