{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T15:58:47Z","timestamp":1781279927247,"version":"3.54.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Key-Area Research and Development Program of Guangdong Province","award":["2020B090920002"],"award-info":[{"award-number":["2020B090920002"]}]},{"name":"Key-Area Research and Development Program of Guangdong Province","award":["2020B0909040004"],"award-info":[{"award-number":["2020B0909040004"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103455"],"award-info":[{"award-number":["62103455"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017607","name":"Shenzhen Fundamental Research Program","doi-asserted-by":"publisher","award":["JCYJ20190807155203586"],"award-info":[{"award-number":["JCYJ20190807155203586"]}],"id":[{"id":"10.13039\/501100017607","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/tie.2022.3142404","type":"journal-article","created":{"date-parts":[[2022,1,19]],"date-time":"2022-01-19T20:29:14Z","timestamp":1642624154000},"page":"12030-12041","source":"Crossref","is-referenced-by-count":48,"title":["Fault Tolerant Maximum Torque Per Ampere (FT-MTPA) Control for Dual Three-Phase Interior PMSMs Under Open-Phase Fault"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4986-8586","authenticated-orcid":false,"given":"Guodong","family":"Feng","sequence":"first","affiliation":[{"name":"School of Intelligent Systems Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuting","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Intelligent Systems Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0545-547X","authenticated-orcid":false,"given":"Chunyan","family":"Lai","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Concordia University, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5771-1204","authenticated-orcid":false,"given":"Beichen","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Intelligent Systems Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Narayan C.","family":"Kar","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Windsor, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2447733"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3026271"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2920400"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2620426"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2455595"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2707330"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2900073"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2942985"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2900599"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876400"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2830507"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2559498"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2478337"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2639070"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2782011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2820060"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3032668"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918485"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2326084"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2295537"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2365814"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2722470"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2906431"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2495240"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2524415"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823684"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2789245"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880698"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2750620"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3019391"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3039205"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2826473"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944066"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2931712"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3077235"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2854550"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2216241"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2703682"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2883665"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2606138"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9971147\/09686608.pdf?arnumber=9686608","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T22:33:57Z","timestamp":1705185237000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9686608\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":41,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3142404","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}