{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:06:32Z","timestamp":1777651592067,"version":"3.51.4"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107189"],"award-info":[{"award-number":["52107189"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of Hunan Province","doi-asserted-by":"publisher","award":["2021JJ40076"],"award-info":[{"award-number":["2021JJ40076"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,1]]},"DOI":"10.1109\/tie.2022.3146519","type":"journal-article","created":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T20:33:54Z","timestamp":1643747634000},"page":"39-51","source":"Crossref","is-referenced-by-count":26,"title":["VSFPWM Based on Circulating Current Ripple Prediction for ZVS in Two Paralleled Grid-Tied Inverters With Coupled Inductors"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8940-9966","authenticated-orcid":false,"given":"Qiao","family":"Li","sequence":"first","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6916-102X","authenticated-orcid":false,"given":"Yafei","family":"Ma","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnets Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuan","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnets Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9986-0577","authenticated-orcid":false,"given":"Dong","family":"Jiang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnets Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yechi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Dalian Maritime University, Dalian, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2943742"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2886139"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2910048"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2816004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2701762"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2701558"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2184559"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2900232"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2018.8650408"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2508143"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2017.7930943"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2571302"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7855024"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2258941"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2225075"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104604"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/APEC39645.2020.9124368"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2903884"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2016.0135"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2854302"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2240701"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2712620"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2874036"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050379"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/41.982262"},{"key":"ref26","article-title":"SiC MOSFET"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/28.936396"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9866919\/09700752.pdf?arnumber=9700752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:28:21Z","timestamp":1705534101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9700752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1]]},"references-count":27,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3146519","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1]]}}}