{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T20:09:04Z","timestamp":1775678944190,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","award":["I2IPJ 538617-2019"],"award-info":[{"award-number":["I2IPJ 538617-2019"]}],"id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,10]]},"DOI":"10.1109\/tie.2022.3146607","type":"journal-article","created":{"date-parts":[[2022,2,10]],"date-time":"2022-02-10T20:23:22Z","timestamp":1644524602000},"page":"10079-10089","source":"Crossref","is-referenced-by-count":20,"title":["A Multivariable Phase-Locked Loop-Integrated Controller for Enhanced Performance of Voltage Source Converters Under Weak Grid Conditions"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0895-7694","authenticated-orcid":false,"given":"Seyed Milad","family":"Hoseinizadeh","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montreal, Montreal, QC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4956-0925","authenticated-orcid":false,"given":"Houshang","family":"Karimi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montreal, Montreal, QC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8112-8166","authenticated-orcid":false,"given":"Masoud","family":"Karimi-Ghartemani","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Mississippi State University, Mississippi State, MS, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8758-3293","authenticated-orcid":false,"given":"Saeed","family":"Ouni","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montreal, Montreal, QC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2573759"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2185017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2564340"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3086716"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2334665"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3065614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2546341"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868271"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3127644"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3095791"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2015.2490549"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8927124"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3079463"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2978689"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2330518"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2015.0103"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3112989"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2909532"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2261035"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2021.3065205"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2366104"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2265252"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2893857"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2019.2898012"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2883507"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2898268"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3066512"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2019.8781486"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3031206"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2007.894860"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1981.1102558"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2895839"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9768205\/09709714.pdf?arnumber=9709714","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:13:28Z","timestamp":1705536808000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9709714\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10]]},"references-count":32,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3146607","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,10]]}}}