{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T16:25:28Z","timestamp":1775838328091,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007053","name":"Korea Institute of Energy Technology Evaluation and Planning","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100007053","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["20212020800020"],"award-info":[{"award-number":["20212020800020"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tie.2022.3156036","type":"journal-article","created":{"date-parts":[[2022,3,9]],"date-time":"2022-03-09T20:25:18Z","timestamp":1646857518000},"page":"1586-1596","source":"Crossref","is-referenced-by-count":38,"title":["Open-Circuit Fault-Tolerant Control for a Three-Phase Current-Fed Dual Active Bridge DC\u2013DC Converter"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4244-4764","authenticated-orcid":false,"given":"Tat-Thang","family":"Le","sequence":"first","affiliation":[{"name":"Department of Electrical and Information Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1774-0817","authenticated-orcid":false,"given":"Minh-Khai","family":"Nguyen","sequence":"additional","affiliation":[{"name":"General Motors, Warren, MI, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8192-9513","authenticated-orcid":false,"given":"Truong-Duy","family":"Duong","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Chonnam National University, Gwangju, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1315-8053","authenticated-orcid":false,"given":"Caisheng","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Wayne State University, Detroit, MI, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9996-1239","authenticated-orcid":false,"given":"Sewan","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2160284"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2969113"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3069964"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2431273"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2684832"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS50442.2020.9290902"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2919530"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC51675.2021.9490140"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2060498"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192503"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MPEL.2018.2874345"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2899133"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2866109"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2865092"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933487"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2975348"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2937066"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2916825"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2921849"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2978752"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2272381"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.909236"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2226059"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2027535"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2173589"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.910627"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/INDUSCON.2012.6453004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2931739"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2972014"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2432093"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3127010"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3016684"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9595031"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9913345\/09732277.pdf?arnumber=9732277","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:42:05Z","timestamp":1705534925000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9732277\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":33,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3156036","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}