{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:36:02Z","timestamp":1780500962777,"version":"3.54.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177044"],"award-info":[{"award-number":["52177044"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52025073"],"award-info":[{"award-number":["52025073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2019T120395"],"award-info":[{"award-number":["2019T120395"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hong Kong Scholars Program","award":["XJ2019031"],"award-info":[{"award-number":["XJ2019031"]}]},{"name":"Natural Science Foundation of Jiangsu Higher Education Institutions","award":["21KJA470004"],"award-info":[{"award-number":["21KJA470004"]}]},{"DOI":"10.13039\/501100012246","name":"Priority Academic Program Development of Jiangsu Higher Education Institutions","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012246","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tie.2022.3161757","type":"journal-article","created":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T19:43:20Z","timestamp":1648583000000},"page":"1229-1238","source":"Crossref","is-referenced-by-count":28,"title":["Analysis of Split-Tooth Stator PM Vernier Machines With Zero-Sequence Current Excitation"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3823-6575","authenticated-orcid":false,"given":"Tingting","family":"Jiang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu Key Laboratory of Drive and Intelligent Control for Electric Vehicle, and the National Center for International Research on Structural Health Management of Critical Components, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4444-6595","authenticated-orcid":false,"given":"Wenxiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu Key Laboratory of Drive and Intelligent Control for Electric Vehicle, and the National Center for International Research on Structural Health Management of Critical Components, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7545-1688","authenticated-orcid":false,"given":"Liang","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu Key Laboratory of Drive and Intelligent Control for Electric Vehicle, and the National Center for International Research on Structural Health Management of Critical Components, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123853"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS12746.2007.4412208"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-011-0057-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-012-0022-6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-011-0718-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682792"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/IPEC.2018.8507395"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2879405"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/ip-epa:20030909"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2750206"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3048442"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2901448"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3079344"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3053901"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2920600"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2572659"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2779805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2610399"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2157309"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3031535"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9913345\/09744425.pdf?arnumber=9744425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T00:09:49Z","timestamp":1705536589000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9744425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3161757","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}