{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T16:38:30Z","timestamp":1782405510174,"version":"3.54.5"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tie.2022.3165260","type":"journal-article","created":{"date-parts":[[2022,4,12]],"date-time":"2022-04-12T19:30:59Z","timestamp":1649791859000},"page":"2026-2036","source":"Crossref","is-referenced-by-count":57,"title":["Series Arc Fault Detection Using Regular Signals and Time-Series Reconstruction"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8059-0597","authenticated-orcid":false,"given":"Run","family":"Jiang","sequence":"first","affiliation":[{"name":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4498-8001","authenticated-orcid":false,"given":"Yuesheng","family":"Zheng","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2922926"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3044787"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3095819"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3403\/30248612u"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2931276"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2627248"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2929329"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PHM-Qingdao46334.2019.8943054"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2888591"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2927635"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880719"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2898619"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3153333"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2885945"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2826878"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2905358"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2960512"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9091367"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/s20174910"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3069849"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s20010162"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027002"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MIAS.2019.2943664"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.2478\/jee-2018-0045"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3067660"},{"issue":"2","key":"ref26","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1023\/A:1009715923555","article-title":"A tutorial on support vector machine for pattern recognition","volume":"2","author":"Burges","year":"1998","journal-title":"Data Mining Knowl. Discov."},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7299173"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9913345\/09756255.pdf?arnumber=9756255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T01:04:20Z","timestamp":1706058260000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9756255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":27,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3165260","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}