{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:52:09Z","timestamp":1772121129108,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177043"],"award-info":[{"award-number":["52177043"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51907073"],"award-info":[{"award-number":["51907073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hubei Provincial Natural Science Foundation of China","award":["2021CFA076"],"award-info":[{"award-number":["2021CFA076"]}]},{"name":"Applied Basic Frontier Program of Wuhan","award":["2020010601012207"],"award-info":[{"award-number":["2020010601012207"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/tie.2022.3167152","type":"journal-article","created":{"date-parts":[[2022,4,19]],"date-time":"2022-04-19T19:31:56Z","timestamp":1650396716000},"page":"2351-2362","source":"Crossref","is-referenced-by-count":47,"title":["Zero-Sequence Current Suppression Method for Fault-Tolerant OW-PMSM Drive With Asymmetric Zero-Sequence Voltage Injection"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0960-3356","authenticated-orcid":false,"given":"Chong","family":"Zhang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7563-7415","authenticated-orcid":false,"given":"Chun","family":"Gan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7467-2921","authenticated-orcid":false,"given":"Kai","family":"Ni","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2556-1544","authenticated-orcid":false,"given":"Zhiyue","family":"Yu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0588-6926","authenticated-orcid":false,"given":"Yu","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9675-6942","authenticated-orcid":false,"given":"Haochen","family":"Shi","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6375-0990","authenticated-orcid":false,"given":"Ronghai","family":"Qu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2207741"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2676020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2366715"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2906975"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2353415"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2953805"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3139233"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3130329"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3149536"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3087119"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2897541"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2679678"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2901275"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3128387"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3030237"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2975121"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2209615"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2806740"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2549983"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2003.819670"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2896222"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3069891"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"595","DOI":"10.1109\/TIE.2014.2386299","article-title":"Fault-tolerant operation of an open-end winding five-phase PMSM drive with short-circuit inverter fault","volume":"63","author":"ngac","year":"2016","journal-title":"IEEE Trans Ind Electron"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2325891"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3039896"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2464803"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2835821"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2924821"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9955034\/09760230.pdf?arnumber=9760230","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:26:20Z","timestamp":1670873180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9760230\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":29,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3167152","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}