{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T15:26:50Z","timestamp":1780586810738,"version":"3.54.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002784","name":"Canada Excellence Research Chairs, Government of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002784","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/tie.2022.3183275","type":"journal-article","created":{"date-parts":[[2022,6,21]],"date-time":"2022-06-21T19:38:17Z","timestamp":1655840297000},"page":"4620-4630","source":"Crossref","is-referenced-by-count":34,"title":["Induced Current Reduction in Position-Sensorless SRM Drives Using Pulse Injection"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1157-9209","authenticated-orcid":false,"given":"Dianxun","family":"Xiao","sequence":"first","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7756-5104","authenticated-orcid":false,"given":"Jin","family":"Ye","sequence":"additional","affiliation":[{"name":"Intelligent Power Electronics and Electric Machine Laboratory, University of Georgia, Athens, GA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3746-0698","authenticated-orcid":false,"given":"Gaoliang","family":"Fang","sequence":"additional","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9302-7610","authenticated-orcid":false,"given":"Zekun","family":"Xia","sequence":"additional","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4135-4855","authenticated-orcid":false,"given":"Haomin","family":"Li","sequence":"additional","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8173-3331","authenticated-orcid":false,"given":"Xueqing","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3452-2731","authenticated-orcid":false,"given":"Babak","family":"Nahid-Mobarakeh","sequence":"additional","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0676-1455","authenticated-orcid":false,"given":"Ali","family":"Emadi","sequence":"additional","affiliation":[{"name":"McMaster Automotive Resource Centre, McMaster University, Hamilton, ON, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.2993725"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2922937"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3059554"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3110867"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955409"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2893763"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3017864"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3096738"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3067955"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2672523"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2129597"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2870892"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3088064"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/28.903127"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3081618"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2007.895746"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3070640"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-esi.2019.0041"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2420618"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2001.912468"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8557719"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2179065"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2723542"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955404"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3130273"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2983103"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.01.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2765522"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10005867\/09802819.pdf?arnumber=9802819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,30]],"date-time":"2025-06-30T17:38:35Z","timestamp":1751305115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9802819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":28,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3183275","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}