{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T10:11:03Z","timestamp":1775729463962,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51879027"],"award-info":[{"award-number":["51879027"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51979021"],"award-info":[{"award-number":["51979021"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/tie.2022.3186343","type":"journal-article","created":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T19:28:03Z","timestamp":1656703683000},"page":"4608-4619","source":"Crossref","is-referenced-by-count":33,"title":["A Novel Error-Injected Solution for Compensation of Current Measurement Errors in PMSM Drive"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7093-9863","authenticated-orcid":false,"given":"Qiaofen","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Dalian Maritime University, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4291-6722","authenticated-orcid":false,"given":"Haohao","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Marine Engineering, Dalian Maritime University, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8284-4797","authenticated-orcid":false,"given":"Yancheng","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Marine Engineering, Dalian Maritime University, Dalian, China"}]},{"given":"Chen","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Dalian Maritime University, Dalian, China"}]},{"given":"Fengkui","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Marine Engineering, Dalian Maritime University, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6702-0784","authenticated-orcid":false,"given":"Zhenrui","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Marine Engineering, Dalian Maritime University, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3275-1733","authenticated-orcid":false,"given":"Guanhua","family":"Li","sequence":"additional","affiliation":[{"name":"School of Marine Engineering, Dalian Maritime University, Dalian, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2914639"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2870904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/28.663477"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2301873"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2865348"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2006.889999"},{"key":"ref7","article-title":"Compensation method for current-sensor gain errors","author":"Myers","year":"2006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.916730"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2023487"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877162"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.0946"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2679126"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2354593"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2004.841513"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.820537"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2725824"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912798"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.880904"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.2002170"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.926208"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MIA.2007.4283506"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2042420"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2311098"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2274414"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106866"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10005867\/09813437.pdf?arnumber=9813437","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:07:38Z","timestamp":1706760458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9813437\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":25,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3186343","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}