{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T19:03:52Z","timestamp":1769281432364,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51761135112"],"award-info":[{"award-number":["51761135112"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177031"],"award-info":[{"award-number":["52177031"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["DO 1966\/2-1"],"award-info":[{"award-number":["DO 1966\/2-1"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["201906120213"],"award-info":[{"award-number":["201906120213"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/tie.2022.3189065","type":"journal-article","created":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T19:26:51Z","timestamp":1657740411000},"page":"4461-4471","source":"Crossref","is-referenced-by-count":31,"title":["Analysis of Back EMF Harmonics Influenced by Slot\u2013Pole Combinations in Permanent Magnet Vernier In-Wheel Motors"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7751-2333","authenticated-orcid":false,"given":"Yanlei","family":"Yu","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8377-7098","authenticated-orcid":false,"given":"Yulong","family":"Pei","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4402-3362","authenticated-orcid":false,"given":"Feng","family":"Chai","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7231-7459","authenticated-orcid":false,"given":"Martin","family":"Doppelbauer","sequence":"additional","affiliation":[{"name":"Elektrotechnisches Institut, Karlsruhe Institute of Technology, Karlsruhe, Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2472375"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2252131"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1108\/03321641111091403"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2030211"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2313693"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7309964"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2871889"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8202"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2318173"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2795000"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/28.887204"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1963.291362"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2913827"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2938484"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2842739"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2842736"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878113"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2437361"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2581768"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1999.799197"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2778686"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2434931"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2355178"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2436714"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2665626"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2008.2006557"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2168794"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2517144"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2702278"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3168007"},{"key":"ref31","first-page":"1","article-title":"Sinusoidal back-EMF of vernier permanent magnet machines","volume-title":"Proc. 15th Int. Conf. Elect. Mach. Syst.","author":"Li"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1002\/9781118701591"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2001.955749"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10005867\/09829197.pdf?arnumber=9829197","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T06:19:46Z","timestamp":1706768386000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9829197\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":33,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3189065","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}