{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,13]],"date-time":"2025-11-13T07:21:43Z","timestamp":1763018503791,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Youth Program of National Natural Science Foundation of China","award":["52007049","51907048"],"award-info":[{"award-number":["52007049","51907048"]}]},{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"crossref","award":["E2021202164"],"award-info":[{"award-number":["E2021202164"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100008238","name":"Bureau of Science and Technology of Hebei Province","doi-asserted-by":"publisher","award":["E2021202046"],"award-info":[{"award-number":["E2021202046"]}],"id":[{"id":"10.13039\/501100008238","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003482","name":"Department of Education of Hebei Province","doi-asserted-by":"publisher","award":["QN2020410"],"award-info":[{"award-number":["QN2020410"]}],"id":[{"id":"10.13039\/501100003482","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100016083","name":"Hebei Provincial Department of Human Resources and Social Security","doi-asserted-by":"publisher","award":["C20210333"],"award-info":[{"award-number":["C20210333"]}],"id":[{"id":"10.13039\/100016083","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology","award":["EERI_OY2020006"],"award-info":[{"award-number":["EERI_OY2020006"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/tie.2022.3192666","type":"journal-article","created":{"date-parts":[[2022,7,26]],"date-time":"2022-07-26T19:29:50Z","timestamp":1658863790000},"page":"6366-6376","source":"Crossref","is-referenced-by-count":8,"title":["A Load-Independent Controllable Z-Source Circuit Breaker With an Intrinsic Fault Detection Method"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8145-0673","authenticated-orcid":false,"given":"Ju","family":"Xue","sequence":"first","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7229-988X","authenticated-orcid":false,"given":"Zhen","family":"Xin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6489-0135","authenticated-orcid":false,"given":"Jianliang","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"given":"Yuansheng","family":"Yue","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"given":"Jianlong","family":"Kang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2962762"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ecce.2014.6953414"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2219832"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2011.5744620"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/INTLEC.2016.7749139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCEP.2017.8004775"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2014.6869742"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2297304"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342217"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2850441"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2765670"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878115"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2797243"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3003358"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3073895"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2540808"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2178125"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ESTS.2011.5770893"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2415775"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2764903"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7309928"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2928284"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3000133"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3023653"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3006889"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2980543"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2970657"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3000246"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2984055"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.23919\/EPE17ECCEEurope.2017.8099221"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2882497"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2922645"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.2018.8479167"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3092773"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10026526\/09841419.pdf?arnumber=9841419","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T09:52:04Z","timestamp":1706781124000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9841419\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":34,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3192666","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}