{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T01:41:38Z","timestamp":1782783698825,"version":"3.54.5"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2020YFC2200204"],"award-info":[{"award-number":["2020YFC2200204"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51722506"],"award-info":[{"award-number":["51722506"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Equipment Development Department Project"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/tie.2022.3192677","type":"journal-article","created":{"date-parts":[[2022,7,26]],"date-time":"2022-07-26T19:29:50Z","timestamp":1658863790000},"page":"6405-6413","source":"Crossref","is-referenced-by-count":25,"title":["A Dual-Beam Differential Method Based on Feedback Interferometry for Noncontact Measurement of Linear and Angular Displacement"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3839-6050","authenticated-orcid":false,"given":"Xin","family":"Xu","sequence":"first","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0636-4839","authenticated-orcid":false,"given":"Zongren","family":"Dai","sequence":"additional","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9906-7875","authenticated-orcid":false,"given":"Yidong","family":"Tan","sequence":"additional","affiliation":[{"name":"Department of Precision Instruments, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICMA.2016.7558602"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.1997.606708"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-012-1217-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2003.12.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1145605"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0264-9381\/26\/8\/085008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0264-9381\/33\/3\/035010"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12217-019-09769-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2012.10.016"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2698417"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2977540"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2726982"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677308"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2886762"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2992954"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2591899"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/23\/5\/054008"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.54.8.084112"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4936771"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2009.02.004"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s19235289"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2021.107352"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OE.22.025587"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962414"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OE.433387"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.412898"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.442057"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/AO.51.004841"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.64.043815"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/s110202195"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.201100002"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.7.000570"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.4.000729"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1364\/OE.26.010371"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1364\/OL.43.001531"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1364\/OL.44.005414"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3114705"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1063\/1.4947494"},{"key":"ref40","article-title":"Introduction to IQ-demodulation of RF-data","volume":"15","author":"Kirkhorn","year":"1999","journal-title":"IFBT"},{"key":"ref41","article-title":"5530 laser calibration system","year":"2022"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10026526\/09841438.pdf?arnumber=9841438","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T08:52:37Z","timestamp":1706777557000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9841438\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":40,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3192677","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}