{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T16:49:12Z","timestamp":1780073352220,"version":"3.54.0"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2017YFB0903100"],"award-info":[{"award-number":["2017YFB0903100"]}]},{"name":"Science and Technology Projects of State Grid Corporation of China","award":["521104170043"],"award-info":[{"award-number":["521104170043"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/tie.2022.3194584","type":"journal-article","created":{"date-parts":[[2022,8,3]],"date-time":"2022-08-03T19:29:52Z","timestamp":1659554992000},"page":"6239-6249","source":"Crossref","is-referenced-by-count":54,"title":["An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient Boosting"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3089-8950","authenticated-orcid":false,"given":"Xue","family":"Hu","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5966-394X","authenticated-orcid":false,"given":"Hefei","family":"Jia","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1054-5851","authenticated-orcid":false,"given":"Yuedong","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Polytechnic, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3200-0366","authenticated-orcid":false,"given":"Yan","family":"Deng","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2883989"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2833045"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2015.2413935"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2015.2462717"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3028808"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2679439"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2016.2526684"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2756849"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2016.2526684"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2928248"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2013.2242093"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2015.2454534"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2849441"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2014.2348194"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2796584"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2906897"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2015.2477476"},{"issue":"12","key":"ref18","first-page":"127","article-title":"Intelligent diagnosis method for open-circuit fault of sub-modules in modular five-level inverter","volume":"42","author":"Yin","year":"2018","journal-title":"Automat. Electron. Power Syst."},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2019.2892595"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/npsc49263.2020.9331902"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3055155"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10026526\/09849436.pdf?arnumber=9849436","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T10:58:37Z","timestamp":1706785117000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9849436\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":22,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3194584","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}