{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T17:33:16Z","timestamp":1779384796021,"version":"3.53.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["NRF2019R1A2C108460511"],"award-info":[{"award-number":["NRF2019R1A2C108460511"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/tie.2022.3196375","type":"journal-article","created":{"date-parts":[[2022,8,10]],"date-time":"2022-08-10T19:27:44Z","timestamp":1660159664000},"page":"5971-5981","source":"Crossref","is-referenced-by-count":14,"title":["Single-Stage Isolated DC\/AC Converter With Continuous Dynamic Model and Controller Design"],"prefix":"10.1109","volume":"70","author":[{"given":"Mohamed Atef","family":"Tawfik","sequence":"first","affiliation":[{"name":"Soongsil University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2561-2009","authenticated-orcid":false,"given":"Muhammad","family":"Ehab","sequence":"additional","affiliation":[{"name":"Soongsil University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9963-8834","authenticated-orcid":false,"given":"Ashraf","family":"Ahmed","sequence":"additional","affiliation":[{"name":"Soongsil University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5694-417X","authenticated-orcid":false,"given":"Joung-Hu","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Soongsil University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2277917"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2968914"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2756600"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2212917"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2279950"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2716873"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2032201"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2413815"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2752127"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2811678"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2564360"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2476336"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2633507"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2017.2723944"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3120483"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2006.882969"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2038943"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2669148"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2997983"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-5478-5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2543182"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2964065"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3130055"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3016684"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2320233"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10026526\/09854399.pdf?arnumber=9854399","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T12:14:36Z","timestamp":1706789676000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9854399\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":25,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3196375","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}