{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T16:44:52Z","timestamp":1774629892858,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2019JBZ101"],"award-info":[{"award-number":["2019JBZ101"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,7]]},"DOI":"10.1109\/tie.2022.3199938","type":"journal-article","created":{"date-parts":[[2022,8,24]],"date-time":"2022-08-24T19:26:38Z","timestamp":1661369198000},"page":"6482-6493","source":"Crossref","is-referenced-by-count":48,"title":["Temperature Analysis for the Asymmetric Six-Phase Permanent Magnet Synchronous Motor in Healthy and Fault-Tolerant Modes"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6531-863X","authenticated-orcid":false,"given":"Haoyue","family":"Tang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5020-3805","authenticated-orcid":false,"given":"Jun","family":"Di","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhigang","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1465-7014","authenticated-orcid":false,"given":"Weili","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2447733"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3072947"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2293195"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2982324"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944056"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2900599"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2703682"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2087300"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2171175"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2448211"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2559498"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918485"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2639070"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2632118"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2258452"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/WEMDCD.2019.8887772"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2479410"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2956353"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3091664"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/28.464525"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2019.0736"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.2996817"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/elp2.12065"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.922604"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10048563\/09866636.pdf?arnumber=9866636","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T12:25:34Z","timestamp":1706790334000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9866636\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7]]},"references-count":24,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3199938","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,7]]}}}