{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T16:25:12Z","timestamp":1779294312842,"version":"3.51.4"},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51922028"],"award-info":[{"award-number":["51922028"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","award":["BK20211189"],"award-info":[{"award-number":["BK20211189"]}],"id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["3216002208A1"],"award-info":[{"award-number":["3216002208A1"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,7]]},"DOI":"10.1109\/tie.2022.3203758","type":"journal-article","created":{"date-parts":[[2022,9,9]],"date-time":"2022-09-09T20:52:47Z","timestamp":1662756767000},"page":"7521-7524","source":"Crossref","is-referenced-by-count":27,"title":["Active Control Strategy of Partial Discharge for Insulation of High-Power High-Voltage High-Frequency Transformers (H<sup>3<\/sup>Ts)"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1349-3225","authenticated-orcid":false,"given":"Jun","family":"Jiang","sequence":"first","affiliation":[{"name":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1835-7564","authenticated-orcid":false,"given":"Wu","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1221-018X","authenticated-orcid":false,"given":"Yu","family":"Song","sequence":"additional","affiliation":[{"name":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3610-8016","authenticated-orcid":false,"given":"Zhan","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2016.2589061"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2020.00003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2293471"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3132695"},{"issue":"1","key":"ref5","doi-asserted-by":"crossref","first-page":"214","DOI":"10.1109\/TDEI.2019.008394","article-title":"Partial discharge inception voltage of voids enclosed in epoxymica versus voltage frequency and temperature","volume":"27","author":"Aakre","year":"2020","journal-title":"IEEE Trans. Dielect. Elect. Insul."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3108721"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2021.3053960"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/28.67533"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2020.2975049"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10048563\/09884975.pdf?arnumber=9884975","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:12:04Z","timestamp":1705687924000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9884975\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7]]},"references-count":9,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3203758","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,7]]}}}