{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T04:00:33Z","timestamp":1778817633626,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12272199"],"award-info":[{"award-number":["12272199"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12272199"],"award-info":[{"award-number":["12272199"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100011429","name":"State Key Laboratory of Tribology","doi-asserted-by":"publisher","award":["SKLT2021D11"],"award-info":[{"award-number":["SKLT2021D11"]}],"id":[{"id":"10.13039\/501100011429","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tie.2022.3206754","type":"journal-article","created":{"date-parts":[[2022,9,20]],"date-time":"2022-09-20T19:28:09Z","timestamp":1663702089000},"page":"9483-9494","source":"Crossref","is-referenced-by-count":16,"title":["Motor Current Model for Detecting Localized Defects in Planet Rolling Bearings"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3625-2694","authenticated-orcid":false,"given":"Qinkai","family":"Han","sequence":"first","affiliation":[{"name":"The State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziyuan","family":"Jiang","sequence":"additional","affiliation":[{"name":"The State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0728-7206","authenticated-orcid":false,"given":"Yun","family":"Kong","sequence":"additional","affiliation":[{"name":"The State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianyang","family":"Wang","sequence":"additional","affiliation":[{"name":"The State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0775-3593","authenticated-orcid":false,"given":"Fulei","family":"Chu","sequence":"additional","affiliation":[{"name":"The State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.01.041"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2009.09.022"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2014.11.015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11012-017-0680-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1177\/0309324718769491"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108100"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2019.02.024"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.02.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.106304"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.07.039"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2020.01.093"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2022.107263"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2022.107387"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.878303"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.882636"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2194950"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2360068"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.02.037"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2052540"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2821099"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2018.8397840"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2019.03.030"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2106094"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2016.7731964"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106861"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.10.014"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2012.08.002"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2410254"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2875447"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2973894"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2600599"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.07.039"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-8933-0"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2006.875471"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2035513"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2009.5075193"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2007.4417662"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.06.010"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.107711"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3901\/jme.2021.02.011"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10091710\/09896756.pdf?arnumber=9896756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:20:36Z","timestamp":1705958436000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9896756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":40,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3206754","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}