{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,13]],"date-time":"2026-08-13T03:48:28Z","timestamp":1786592908416,"version":"build-2736575974"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U21A20481"],"award-info":[{"award-number":["U21A20481"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973071"],"award-info":[{"award-number":["61973071"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018617","name":"LiaoNing Revitalization Talents Program","doi-asserted-by":"publisher","award":["XLYC2002046"],"award-info":[{"award-number":["XLYC2002046"]}],"id":[{"id":"10.13039\/501100018617","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["N2104020"],"award-info":[{"award-number":["N2104020"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tie.2022.3210557","type":"journal-article","created":{"date-parts":[[2022,10,5]],"date-time":"2022-10-05T19:30:48Z","timestamp":1664998248000},"page":"9550-9560","source":"Crossref","is-referenced-by-count":41,"title":["Defect Size Quantification for Pipeline Magnetic Flux Leakage Detection System via Multilevel Knowledge-Guided Neural Network"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9809-3791","authenticated-orcid":false,"given":"Lei","family":"Wang","sequence":"first","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2375-9824","authenticated-orcid":false,"given":"Huaguang","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Synthetical Automation for Processes Industries, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1256-1337","authenticated-orcid":false,"given":"Jinhai","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Synthetical Automation for Processes Industries, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8072-9568","authenticated-orcid":false,"given":"Fuming","family":"Qu","sequence":"additional","affiliation":[{"name":"School of Civil and Resource Engineering, University of Science and Technology Beijing, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9642-5705","authenticated-orcid":false,"given":"Fengyuan","family":"Zuo","sequence":"additional","affiliation":[{"name":"College of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2846283"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3050185"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733449"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3148755"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3127016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpvp.2010.04.003"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3146152"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2982085"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3152243"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpvp.2016.11.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2014.03.017"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3062421"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2949520"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2208119"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2690628"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3095593"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.01.004"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2012.11.053"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3036159"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2631525"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3141771"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/17686733.2020.1810883"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2828811"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.cma.2020.113492"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.dche.2021.100002"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.taml.2021.100220"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984444"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2755918"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref32","first-page":"385","article-title":"Calculation of the magnetostatic field of surface defects","volume":"2","author":"Zatsepin","year":"1966","journal-title":"Defektoskopiya"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2008.2011895"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/19\/4\/018"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2009.55"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10091710\/09912333.pdf?arnumber=9912333","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:22:28Z","timestamp":1705962148000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9912333\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":35,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3210557","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}