{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:31:58Z","timestamp":1782970318252,"version":"3.54.5"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Science and Technology Innovation Program of Hunan Province","award":["2021RC2046"],"award-info":[{"award-number":["2021RC2046"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1109\/tie.2022.3212371","type":"journal-article","created":{"date-parts":[[2022,10,12]],"date-time":"2022-10-12T19:38:46Z","timestamp":1665603526000},"page":"7695-7705","source":"Crossref","is-referenced-by-count":101,"title":["A Robust DPCC for IPMSM Based on a Full Parameter Identification Method"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1059-3597","authenticated-orcid":false,"given":"Yizhe","family":"Wang","sequence":"first","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0582-3906","authenticated-orcid":false,"given":"Wu","family":"Liao","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0126-4430","authenticated-orcid":false,"given":"Sheng","family":"Huang","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ji","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0374-0464","authenticated-orcid":false,"given":"Meizhou","family":"Yang","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3198-3703","authenticated-orcid":false,"given":"Chengxu","family":"Li","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6923-9605","authenticated-orcid":false,"given":"Shoudao","family":"Huang","sequence":"additional","affiliation":[{"name":"College of Electrical and Infor-mation Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2205360"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2670623"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2835835"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2002.802183"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036030"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2168789"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3062271"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2221469"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2592534"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3065622"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2920439"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2960755"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3076718"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3051212"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3135610"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036029"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2016.2538180"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2572186"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3000896"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/41.720327"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2195203"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2306734"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192451"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2900559"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2311098"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10075413\/09917358.pdf?arnumber=9917358","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:54:20Z","timestamp":1705964060000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9917358\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8]]},"references-count":25,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3212371","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,8]]}}}