{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T15:00:25Z","timestamp":1778079625415,"version":"3.51.4"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Young Elite Scientists Sponsorship Program by CAST","award":["JLB-2021-284"],"award-info":[{"award-number":["JLB-2021-284"]}]},{"DOI":"10.13039\/501100005046","name":"Natural Science Foundation of Heilongjiang Province","doi-asserted-by":"publisher","award":["YQ2021E024"],"award-info":[{"award-number":["YQ2021E024"]}],"id":[{"id":"10.13039\/501100005046","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tie.2022.3215831","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T23:08:58Z","timestamp":1667516938000},"page":"8918-8927","source":"Crossref","is-referenced-by-count":14,"title":["Decoupling Optimization of the Three-Coil Coupler for IPT System Featuring High Efficiency and Misalignment Tolerance"],"prefix":"10.1109","volume":"70","author":[{"given":"Chunxu","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5533-3190","authenticated-orcid":false,"given":"Yousu","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6959-8619","authenticated-orcid":false,"given":"Yijie","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2850838"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2871794"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2970780"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2729083"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0839"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2161055"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2516023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2686301"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2809785"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2179274"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342811"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2606893"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WoW47795.2020.9291298"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2177611"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2290549"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2015.2411616"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2867919"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACPEE51499.2021.9436904"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3021591"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3082777"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.4271\/j2954_202010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2424893"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2179274"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC-AP.2017.8080829"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3103327"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10091710\/09929288.pdf?arnumber=9929288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:56:27Z","timestamp":1705964187000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9929288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":25,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3215831","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}