{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T15:54:52Z","timestamp":1778601292459,"version":"3.51.4"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Joint Fund of National Natural Science Foundation of China","award":["U2166601"],"award-info":[{"award-number":["U2166601"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1109\/tie.2022.3217602","type":"journal-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T01:45:16Z","timestamp":1667526316000},"page":"7832-7844","source":"Crossref","is-referenced-by-count":13,"title":["Robust Single-Loop Control Strategy for Four-Level Flying-Capacitor Converter Based on Switched System Theory"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7109-8135","authenticated-orcid":false,"given":"Wenjie","family":"Ma","sequence":"first","affiliation":[{"name":"School of Electric Power, South China University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9172-698X","authenticated-orcid":false,"given":"Bo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electric Power, South China University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7906-7686","authenticated-orcid":false,"given":"Dongyuan","family":"Qiu","sequence":"additional","affiliation":[{"name":"School of Electric Power, South China University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2030235"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2497218"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2165559"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3119409"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3047039"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2049719"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3051207"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3089477"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2614267"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2942565"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2750610"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2169993"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2089807"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2427201"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2521803"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2157290"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2285387"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2633278"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2876031"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2019.8722314"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3023612"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2930011"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2899899"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2877943"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2951032"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3049515"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838073"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2908597"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878116"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3083900"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3000128"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2726009"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2907381"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2011.2178629"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2004.1384747"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2354732"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2956166"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2865597"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10075413\/09935811.pdf?arnumber=9935811","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:35:37Z","timestamp":1705962937000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9935811\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8]]},"references-count":38,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3217602","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,8]]}}}