{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T09:55:27Z","timestamp":1766138127423,"version":"3.37.3"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2021ZD0201403"],"award-info":[{"award-number":["2021ZD0201403"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62088101"],"award-info":[{"award-number":["62088101"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004835","name":"Zhejiang University","doi-asserted-by":"publisher","award":["ICT2021A10","ICT2022B04"],"award-info":[{"award-number":["ICT2021A10","ICT2022B04"]}],"id":[{"id":"10.13039\/501100004835","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,10]]},"DOI":"10.1109\/tie.2022.3219077","type":"journal-article","created":{"date-parts":[[2022,11,8]],"date-time":"2022-11-08T20:32:04Z","timestamp":1667939524000},"page":"10323-10332","source":"Crossref","is-referenced-by-count":7,"title":["Error Analysis-Based Map Compression for Efficient 3-D Lidar Localization"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5771-128X","authenticated-orcid":false,"given":"Ying","family":"Liu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4311-924X","authenticated-orcid":false,"given":"Junyi","family":"Tao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}]},{"given":"Bin","family":"He","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0043-4904","authenticated-orcid":false,"given":"Yu","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}]},{"given":"Weichen","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Computer Science, Hangzhou Dianzi University, Hangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931521"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2019.2927123"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962416"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA40945.2020.9197450"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2019.2961120"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA48506.2021.9561309"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3008378"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA40945.2020.9197022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA48506.2021.9561335"},{"key":"ref10","first-page":"111","article-title":"Octree-based point-cloud compression","volume-title":"Proc. Point-Based Graph. SIGGRAPH","author":"Schnabel","year":"2006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10514-012-9321-0"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3343031.3351061"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2021.3059633"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00139"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00598"},{"article-title":"Enhance accuracy: Sensitivity and uncertainty theory in LiDAR odometry and mapping","year":"2021","author":"Wan","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2018.2885981"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2015.7353365"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2017.7989523"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2018.00067"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/3DV50981.2020.00111"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2015.7353722"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2015.7139575"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2011.5980567"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IROS45743.2020.9341176"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1017\/9781316671528"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA48506.2021.9561262"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1037\/1082-989X.1.1.16"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2018.8594299"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.15607\/RSS.2014.X.007"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10103730\/09942930.pdf?arnumber=9942930","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:08:09Z","timestamp":1706756889000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9942930\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10]]},"references-count":30,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3219077","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2023,10]]}}}