{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T18:04:21Z","timestamp":1772301861527,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51365006"],"award-info":[{"award-number":["51365006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hechi University","award":["2022XJYB002"],"award-info":[{"award-number":["2022XJYB002"]}]},{"name":"Hechi University","award":["2022YLXK002"],"award-info":[{"award-number":["2022YLXK002"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,10]]},"DOI":"10.1109\/tie.2022.3222694","type":"journal-article","created":{"date-parts":[[2022,11,21]],"date-time":"2022-11-21T21:07:34Z","timestamp":1669064854000},"page":"10567-10577","source":"Crossref","is-referenced-by-count":6,"title":["Iterative Rounded Transient-Synchrosqueezing- Extracting Transform and its Application"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3025-6894","authenticated-orcid":false,"given":"Dahuan","family":"Wei","sequence":"first","affiliation":[{"name":"School of Artificial Intelligence and Manufacturing, Hechi University, Yizhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5226-2147","authenticated-orcid":false,"given":"Bo","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence and Manufacturing, Hechi University, Yizhou, China"}]},{"given":"Zhengjie","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence and Manufacturing, Hechi University, Yizhou, China"}]},{"given":"Yufei","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence and Manufacturing, Hechi University, Yizhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0780-5771","authenticated-orcid":false,"given":"Xinxin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Guangxi University, Nanning, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9724-6706","authenticated-orcid":false,"given":"Zhenfeng","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Guangxi University, Nanning, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5926-296X","authenticated-orcid":false,"given":"Hanling","family":"Mao","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Guangxi University, Nanning, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/78.382394"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2010.08.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2873520"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2012.02.019"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108569"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/1475921720906112"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2276393"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2283552"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2458787"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108592"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2391077"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2016.11.001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2847640"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868296"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2696503"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3031091"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.08.004"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2964109"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984983"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/EUSIPCO.2019.8902342"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2019.107275"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2970571"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109579"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2901514"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107069"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-021-1919-y"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.10.016"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2686355"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.021"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10103730\/09957108.pdf?arnumber=9957108","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T02:11:12Z","timestamp":1706753472000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9957108\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10]]},"references-count":29,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3222694","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,10]]}}}