{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T16:35:56Z","timestamp":1782318956454,"version":"3.54.5"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973306"],"award-info":[{"award-number":["61973306"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,1]]},"DOI":"10.1109\/tie.2022.3225851","type":"journal-article","created":{"date-parts":[[2023,2,22]],"date-time":"2023-02-22T18:29:58Z","timestamp":1677090598000},"page":"975-984","source":"Crossref","is-referenced-by-count":19,"title":["Broken Rotor Bars Detection in Inverter-Fed Induction Motors Under Continuous Switching of Different Speed Modes"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2581-6113","authenticated-orcid":false,"given":"Panpan","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9012-1724","authenticated-orcid":false,"given":"Kaixuan","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8395-5889","authenticated-orcid":false,"given":"Lizheng","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2013.01.018"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2570741"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2178027"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2194148"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3000461"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.01.030"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.08.022"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2917405"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2161252"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2007.383638"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2035991"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2951008"},{"key":"ref2","first-page":"1452","article-title":"Comparative experimental investigation of the broken bar fault detectability in induction motors","volume":"52","author":"gyftakis","year":"2016","journal-title":"IEEE Trans Ind Appl"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.106908"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2874463"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3042195"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2540941"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.07.044"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2993107"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2647458"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2019.8864903"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3007108"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MIAS.2016.2600685"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2017.8062368"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3066317"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.03.001"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2626008"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2619318"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.889915"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2883988"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2464301"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3115170"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2373513"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.12.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3033754"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10184152\/10049414.pdf?arnumber=10049414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:19:46Z","timestamp":1734376786000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10049414\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1]]},"references-count":35,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3225851","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,1]]}}}