{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T17:02:35Z","timestamp":1781283755918,"version":"3.54.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tie.2022.3229275","type":"journal-article","created":{"date-parts":[[2022,12,19]],"date-time":"2022-12-19T14:40:05Z","timestamp":1671460805000},"page":"11357-11367","source":"Crossref","is-referenced-by-count":38,"title":["Synchronverters With Fast Current Loops"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6216-7277","authenticated-orcid":false,"given":"Zeev","family":"Kustanovich","sequence":"first","affiliation":[{"name":"Israel Electricity Company, Haifa, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9537-546X","authenticated-orcid":false,"given":"Shivprasad","family":"Shivratri","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Tel Aviv University, Ramat Aviv, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1762-0594","authenticated-orcid":false,"given":"Hang","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Tel Aviv University, Ramat Aviv, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6602-6145","authenticated-orcid":false,"given":"Florian","family":"Reissner","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Tel Aviv University, Ramat Aviv, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9524-2795","authenticated-orcid":false,"given":"George","family":"Weiss","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Tel Aviv University, Ramat Aviv, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL.2015.7236454"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2008.4596800"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2966524"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2019.000592"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PSCE.2009.4840013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ecce.2013.6647309"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.24084\/repqj16.209"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2645450"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2420657"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674611"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2828338"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/9781118481806"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2565663"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2258684"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2048839"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3107345"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2021.3097954"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2638810"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8218"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2543181"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2259506"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2020.12.1304"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2067771"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s00498-018-0216-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tac.2022.3147167"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2015.7171958"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2012527"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3104617"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2354732"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/9780470667057"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2019.104561"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/BF01447855"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(03)00192-4"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.857558"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/PEMC51159.2022.9962842"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10122185\/09991942.pdf?arnumber=9991942","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T04:21:36Z","timestamp":1709353296000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9991942\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":35,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3229275","relation":{"has-preprint":[{"id-type":"doi","id":"10.36227\/techrxiv.19887322","asserted-by":"object"},{"id-type":"doi","id":"10.36227\/techrxiv.19887322.v1","asserted-by":"object"},{"id-type":"doi","id":"10.36227\/techrxiv.19887322.v2","asserted-by":"object"}]},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}