{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T06:27:43Z","timestamp":1768285663451,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51991381"],"award-info":[{"award-number":["51991381"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tie.2022.3229305","type":"journal-article","created":{"date-parts":[[2022,12,20]],"date-time":"2022-12-20T18:44:01Z","timestamp":1671561841000},"page":"10871-10880","source":"Crossref","is-referenced-by-count":9,"title":["Analysis and Optimization of Rotor Salient Pole Reluctance Considering Multi\u2013Modulation Orders"],"prefix":"10.1109","volume":"70","author":[{"given":"Zhengzhou","family":"Ma","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3466-234X","authenticated-orcid":false,"given":"Ming","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7076-3896","authenticated-orcid":false,"given":"Honghui","family":"Wen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2698836"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2590988"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2402201"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2842741"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2739688"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3047146"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2934064"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2411655"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3055224"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-est.2015.0021"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2655727"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123853"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2934063"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063955"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2719620"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3105460"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2751075"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2378211"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2752753"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2009.0003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2021.000025"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/9781119900375"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682792"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10122185\/09994761.pdf?arnumber=9994761","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:37:45Z","timestamp":1685381865000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9994761\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":24,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3229305","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}