{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:29:11Z","timestamp":1783700951494,"version":"3.55.0"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42276187"],"award-info":[{"award-number":["42276187"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["41876100"],"award-info":[{"award-number":["41876100"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["3072022FSC0401"],"award-info":[{"award-number":["3072022FSC0401"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tie.2022.3229335","type":"journal-article","created":{"date-parts":[[2022,12,20]],"date-time":"2022-12-20T18:44:01Z","timestamp":1671561841000},"page":"11795-11803","source":"Crossref","is-referenced-by-count":15,"title":["A Unified Initial Alignment Method of SINS Based on FGO"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4960-4855","authenticated-orcid":false,"given":"Hanwen","family":"Zhou","sequence":"first","affiliation":[{"name":"College of Intelligent Systems Science and Engineering, Harbin Engineering University, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9812-2679","authenticated-orcid":false,"given":"Xiufen","family":"Ye","sequence":"additional","affiliation":[{"name":"College of Intelligent Systems Science and Engineering, Harbin Engineering University, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA40945.2020.9196698"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3192552"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2016.2594085"},{"key":"ref14","first-page":"2154","article-title":"Factor graph based incremental smoothing in inertial navigation systems","author":"indelman","year":"2012","journal-title":"Proc 15th Int Conf Inf Fusion"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/navi.421"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2018.2853729"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1137\/1007077"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2113131"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3108497"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISS46986.2019.8943781"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1017\/9781316671528"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICUS52573.2021. 9641466"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2967671"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2789138"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2011.6034671"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.07.003"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2008.2006706"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2910045"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1561\/2300000043"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.08.004"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2818673"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/ip-rsn:20030698"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2013.6494395"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2016.130824"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/7.543871"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2878071"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10122185\/09994746.pdf?arnumber=9994746","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:37:06Z","timestamp":1685381826000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9994746\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":26,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3229335","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}