{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T00:37:46Z","timestamp":1775781466298,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52005387"],"award-info":[{"award-number":["52005387"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52025056"],"award-info":[{"award-number":["52025056"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2021T140540"],"award-info":[{"award-number":["2021T140540"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2020M673380"],"award-info":[{"award-number":["2020M673380"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tie.2022.3231273","type":"journal-article","created":{"date-parts":[[2022,12,28]],"date-time":"2022-12-28T18:37:26Z","timestamp":1672252646000},"page":"11764-11773","source":"Crossref","is-referenced-by-count":31,"title":["Machinery Health Prognostics With Multimodel Fusion Degradation Modeling"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0678-8161","authenticated-orcid":false,"given":"Naipeng","family":"Li","sequence":"first","affiliation":[{"name":"Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5167-1459","authenticated-orcid":false,"given":"Yaguo","family":"Lei","sequence":"additional","affiliation":[{"name":"Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}]},{"given":"Xiaofei","family":"Liu","sequence":"additional","affiliation":[{"name":"Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3328-2118","authenticated-orcid":false,"given":"Tao","family":"Yan","sequence":"additional","affiliation":[{"name":"Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4393-4511","authenticated-orcid":false,"given":"Pengcheng","family":"Xu","sequence":"additional","affiliation":[{"name":"Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3075213"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108315"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677334"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"2046","DOI":"10.1109\/TIM.2016.2570398","article-title":"Anomaly detection and fault prognosis for bearings","volume":"65","author":"jin","year":"2016","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.876609"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1177\/1687814016664660"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.11.016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.824875"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.02.017"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.06.057"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s16081242"},{"key":"ref24","first-page":"1","article-title":"XJTU-SY rolling element bearing accelerated life test datasets: A tutorial","volume":"55","author":"lei","year":"2019","journal-title":"J Mech Eng"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2882682"},{"key":"ref25","first-page":"1","article-title":"Metrics for offline evaluation of prognostic performance","volume":"1","author":"saxena","year":"2010","journal-title":"Int Conf Prognostics Health Manage"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.11.008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2012.706376"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011659"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2063"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2307\/1269661"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2570568"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1115\/1.3656900"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.22190\/FUME190112007P"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1115\/GT2013-96008"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10122185\/10002414.pdf?arnumber=10002414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T18:10:58Z","timestamp":1686593458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10002414\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":25,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3231273","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}