{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T13:53:05Z","timestamp":1774965185739,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U21A20167"],"award-info":[{"award-number":["U21A20167"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2022NSFSC1914"],"award-info":[{"award-number":["2022NSFSC1914"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2021T140571"],"award-info":[{"award-number":["2021T140571"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tie.2022.3231279","type":"journal-article","created":{"date-parts":[[2022,12,28]],"date-time":"2022-12-28T18:37:26Z","timestamp":1672252646000},"page":"11725-11734","source":"Crossref","is-referenced-by-count":36,"title":["Abnormal Data Detection Based on Adaptive Sliding Window and Weighted Multiscale Local Outlier Factor for Machinery Health Monitoring"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1662-1330","authenticated-orcid":false,"given":"Qinglin","family":"Xie","sequence":"first","affiliation":[{"name":"State Key Laboratory of Traction Power, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1836-2363","authenticated-orcid":false,"given":"Gongquan","family":"Tao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Traction Power, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1988-565X","authenticated-orcid":false,"given":"Chenxi","family":"Xie","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Traction Power, Southwest Jiaotong University, Chengdu, China"}]},{"given":"Zefeng","family":"Wen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Traction Power, Southwest Jiaotong University, Chengdu, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.09.037"},{"key":"ref35","first-page":"226","article-title":"A density-based algorithm for discovering clusters in large spatial databases with noise","author":"ester","year":"1996","journal-title":"Proc Int Conf Knowl Disc Data Mining"},{"key":"ref12","author":"barnett","year":"1996","journal-title":"Outliers in Statistical Data"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2016.05.007"},{"key":"ref15","first-page":"224","article-title":"Fast computation of 2-dimensional depth contours","author":"johnson","year":"1998","journal-title":"Proc Int'l Conf Knowledge Discovery and Data Mining"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2017.8217235"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s40534-020-00222-x"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2012.21"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-015-3994-4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111624"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10796-017-9822-7"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111268"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2903774"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519325"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.14569\/IJACSA.2020.0110954"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2009.07.004"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2015.10.014"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s007780050006"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2013.184"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2018.09.003"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1948.tb01338.x"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1201\/b11032"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.2014.983231"},{"key":"ref22","article-title":"A meta-analysis of the anomaly detection problem","author":"emmott","year":"2016"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/335191.335388"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/math7070614"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2020.114186"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmrt.2020.12.114"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/BigDataCongress.2015.35"},{"key":"ref7","first-page":"1","article-title":"A survey of machine learning for Big Data processing","volume":"67","author":"qiu","year":"2016","journal-title":"J Adv Signal Process"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2389241.2389244"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1016\/j.ymssp.2019.106587","article-title":"Applications of machine learning to machine fault diagnosis: A review and roadmap","volume":"138","author":"lei","year":"2020","journal-title":"Mech Syst Signal Process"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107077"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-014-0007-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2582729"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10122185\/10002395.pdf?arnumber=10002395","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T18:11:02Z","timestamp":1686593462000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10002395\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":35,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3231279","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}