{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,12]],"date-time":"2026-01-12T09:11:44Z","timestamp":1768209104503,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107165"],"award-info":[{"award-number":["52107165"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"71st Postdoctoral Foundation of China","award":["2022M712511"],"award-info":[{"award-number":["2022M712511"]}]},{"name":"Shaanxi Provincial Key R&D Program","award":["2022GY-269"],"award-info":[{"award-number":["2022GY-269"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tie.2023.3234148","type":"journal-article","created":{"date-parts":[[2023,1,9]],"date-time":"2023-01-09T20:35:35Z","timestamp":1673296535000},"page":"12839-12850","source":"Crossref","is-referenced-by-count":2,"title":["A Fast Dielectric Response Measurement Instrument With Dynamic Power Supply Tracking and Active Suppression of Temperature Fluctuations"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1799-9901","authenticated-orcid":false,"given":"Daning","family":"Zhang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3890-3227","authenticated-orcid":false,"given":"Lulin","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9176-8936","authenticated-orcid":false,"given":"Wenrui","family":"Tian","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8790-6336","authenticated-orcid":false,"given":"Haibao","family":"Mu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4043-3922","authenticated-orcid":false,"given":"Huanmin","family":"Yao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"given":"Haoxiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"given":"Jie","family":"Tian","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8531-4740","authenticated-orcid":false,"given":"Guan-Jun","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2927383"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085837"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2920148"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3006325"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"52","DOI":"10.1109\/TBCAS.2012.2192273","article-title":"Noise analysis and performance comparison of low current measurement systems for biomedical applications","volume":"7","author":"kim","year":"2013","journal-title":"IEEE Trans Biomed Circuits Syst"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4942915"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008530"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2947842"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2822939"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2498129"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2619068"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127306"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2020.008813"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2820701"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1063\/1.4974741","article-title":"Note: A temperature-stable low-noise transimpedance amplifier for microcurrent measurement","volume":"88","author":"xie","year":"2017","journal-title":"Rev Sci Instrum"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3179252"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3157933"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2021.009506"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007076"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2020.009367"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959500"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2016.0264"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2426199"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10153933\/10012583.pdf?arnumber=10012583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T09:06:52Z","timestamp":1701680812000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10012583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":24,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3234148","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}