{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,23]],"date-time":"2025-12-23T10:03:56Z","timestamp":1766484236825,"version":"3.37.3"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877051"],"award-info":[{"award-number":["51877051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tie.2023.3237899","type":"journal-article","created":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T19:35:07Z","timestamp":1674502507000},"page":"11994-12002","source":"Crossref","is-referenced-by-count":7,"title":["Improved Analytical Model for the Magnetic Drag of a Dual-Conductor Plate Parallel Electric Suspension and Guiding Mechanism"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3782-5340","authenticated-orcid":false,"given":"Changchuang","family":"Huang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6312-7960","authenticated-orcid":false,"given":"Baoquan","family":"Kou","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6344-8684","authenticated-orcid":false,"given":"Xiaokun","family":"Zhao","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Niu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.913038"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2848292"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2779415"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/20.43887"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2019558"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3082686"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/77.920122"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/20.911790"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LDIA49489.2021.9505882"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3097089"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2194791"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.911597"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3097603"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2442255"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/pi-a.1958.0036"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311391"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2161638"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2014.7048582"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2006.870013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2174541"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777412"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2514\/6.1994-2726"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1087\/4\/042048"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2697002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2506681"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10153933\/10024914.pdf?arnumber=10024914","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T18:13:22Z","timestamp":1688408002000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10024914\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":25,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3237899","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}