{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:46:03Z","timestamp":1780443963302,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51375363"],"award-info":[{"award-number":["51375363"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52175515"],"award-info":[{"award-number":["52175515"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,2]]},"DOI":"10.1109\/tie.2023.3250764","type":"journal-article","created":{"date-parts":[[2023,3,6]],"date-time":"2023-03-06T18:41:42Z","timestamp":1678128102000},"page":"2080-2089","source":"Crossref","is-referenced-by-count":4,"title":["500-kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nanoresolution"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5419-5515","authenticated-orcid":false,"given":"Lei","family":"Cheng","sequence":"first","affiliation":[{"name":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1384-3333","authenticated-orcid":false,"given":"Jian","family":"Zhuang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tianying","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1556-3805","authenticated-orcid":false,"given":"Xiaobo","family":"Liao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiaxin","family":"Yu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1126\/science.2464851"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/11663_2022_14"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MNANO.2020.3037431"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417126"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202203285"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.biomaterials.2021.121256"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.9b01092"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.0c01735"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.5118360"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.4993296"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4907360"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.5114642"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.5048656"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.0c02840"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.1c01918"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1039\/C8NR10162K"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/nl404068p"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1039\/C7NR04306F"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.1c05202"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2015.2496232"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2192273"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2820701"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/nmeth.1932"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3185457"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b04626"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b09353"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.35848\/1882-0786\/ac7bd4"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.1c02972"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.4891571"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10223597\/10061483.pdf?arnumber=10061483","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:20:19Z","timestamp":1734376819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10061483\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2]]},"references-count":29,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3250764","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,2]]}}}