{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,29]],"date-time":"2026-07-29T14:38:03Z","timestamp":1785335883418,"version":"3.55.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tie.2023.3269467","type":"journal-article","created":{"date-parts":[[2023,4,27]],"date-time":"2023-04-27T14:00:10Z","timestamp":1682604010000},"page":"2903-2913","source":"Crossref","is-referenced-by-count":12,"title":["Virtual Shifting Impedance Method for Extended Range High-Fidelity PHIL Testing"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3479-019X","authenticated-orcid":false,"given":"Alexandros","family":"Paspatis","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Zografou, Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alkistis","family":"Kontou","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5612-0050","authenticated-orcid":false,"given":"Zhiwang","family":"Feng","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3147-0817","authenticated-orcid":false,"given":"Mazheruddin","family":"Syed","sequence":"additional","affiliation":[{"name":"Energy Advisory, WSP, Glasgow, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8397-2213","authenticated-orcid":false,"given":"Georg","family":"Lauss","sequence":"additional","affiliation":[{"name":"EES, AIT Austrian Institute of Technology, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0315-5919","authenticated-orcid":false,"given":"Graeme","family":"Burt","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7927-3516","authenticated-orcid":false,"given":"Panos","family":"Kotsampopoulos","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, National Technical University of Athens, Athens, Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5296-191X","authenticated-orcid":false,"given":"Nikos","family":"Hatziargyriou","sequence":"additional","affiliation":[{"name":"National Technical University of Athens, Athens, Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2015.7392932"},{"key":"ref12","article-title":"Contribution to the design of the closed-loop control of a real-time power simulator","volume":"12","author":"tremblay","year":"2020"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3224196"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2414899"},{"key":"ref31","article-title":"Triphase HPC explained white paper, shaping dynamic response using virtual circuit control","author":"vanassche","year":"2014"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3206780"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2195335"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"1","DOI":"10.3390\/en10121946","article-title":"Operational range of several interface algorithms for different power hardware-in-the-loop setups","volume":"10","author":"brandl","year":"2017","journal-title":"Energies"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2464308"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPETS.2015.2427370"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2011.6119915"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM.2014.6939021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2025242"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9254407"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/EI2.2017.8245393"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IPEMC.2016.7512733"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/PEMC48073.2021.9432569"},{"key":"ref25","author":"franklin","year":"2014","journal-title":"Feedback Control of Dynamic Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2016.7521738"},{"key":"ref22","first-page":"5380","article-title":"Grid integration of PV power based on phil testing using different interface algorithms","author":"cr?ciun","year":"0","journal-title":"Proc IEEE 39th Annu Conf Ind Electron Soc"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/en9110974"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2168592"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2382565"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.851634"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IECON48115.2021.9589158"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3032918"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984969"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2460676"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.926240"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2896093"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IECON49645.2022.9968517"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10255541\/10110377.pdf?arnumber=10110377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,9]],"date-time":"2023-10-09T14:58:27Z","timestamp":1696863507000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10110377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":31,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3269467","relation":{"has-preprint":[{"id-type":"doi","id":"10.36227\/techrxiv.21341298","asserted-by":"object"},{"id-type":"doi","id":"10.36227\/techrxiv.21341298.v1","asserted-by":"object"},{"id-type":"doi","id":"10.36227\/techrxiv.21341298.v2","asserted-by":"object"}]},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}