{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T10:50:08Z","timestamp":1742381408861,"version":"3.37.3"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61874025"],"award-info":[{"award-number":["61874025"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["3207032101D"],"award-info":[{"award-number":["3207032101D"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research & Practice Innovation Program of Jiangsu Province","award":["KYCX20_0086"],"award-info":[{"award-number":["KYCX20_0086"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,5]]},"DOI":"10.1109\/tie.2023.3283713","type":"journal-article","created":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T18:11:05Z","timestamp":1686593465000},"page":"5349-5359","source":"Crossref","is-referenced-by-count":5,"title":["Microseismic Observation Enabled by High-Sensitivity Micromechanical Interferometers"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9252-2097","authenticated-orcid":false,"given":"Cheng","family":"Li","sequence":"first","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1177-1797","authenticated-orcid":false,"given":"Zhenyu","family":"Sun","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4097-7337","authenticated-orcid":false,"given":"Luqiang","family":"Zhou","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3837-0755","authenticated-orcid":false,"given":"Xiang","family":"Zheng","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2284-7339","authenticated-orcid":false,"given":"Xin","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Information Science and Technology, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9223-037X","authenticated-orcid":false,"given":"Xin","family":"Huang","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2855-3662","authenticated-orcid":false,"given":"Bo","family":"Yang","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Micro-Inertial Instrument and Advanced Navigation Technology, School of Instrument Science and Engineering, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abm9916"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1029\/2022GL097814"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.29026\/oea.2021.200045"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.earscirev.2017.04.014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1190\/1.9781560803447"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.pepi.2022.106851"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3149662"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aax0800"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2020.112498"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s19143093"},{"key":"ref11","first-page":"10","article-title":"Developing optomechanical inertial sensors","volume-title":"Proc. SPIE","volume":"11880","author":"Li","year":"2021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1190\/tle33111234.1"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-019-0105-y"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/12.2656109"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2020.3001928"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3098797"},{"key":"ref17","first-page":"2081","article-title":"A silicon seismic package (SSP) for planetary geophysics","volume-title":"Proc. 47th Annu. Lunar Planet. Sci. Conf.","author":"Pike","year":"2016"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-020-67046-x"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/nature17397"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2818066"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2002.1007396"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-16881-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/memsys.2018.8346496"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-021-00340-4"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/INERTIAL51137.2021.9430455"},{"article-title":"Gravity sensors datasheet","year":"2023","author":"SMG","key":"ref26"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/SENSORS43011.2019.8956536"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/PLANS.2012.6236888"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2942797"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2018.2851143"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.116.061102"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/galaxies10010028"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.413117"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1364\/ol.443236"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.4979541"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TRANSDUCERS.2019.8808749"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1364\/ol.452685"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3183640"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1364\/OL.17.000688"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1063\/1.2772114"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2258298"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/74\/3\/036101"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2988243"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2173096"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1970.7896"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10372144\/10149118.pdf?arnumber=10149118","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:48:53Z","timestamp":1705016933000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10149118\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5]]},"references-count":45,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3283713","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2024,5]]}}}