{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T13:03:30Z","timestamp":1770728610613,"version":"3.49.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51835007"],"award-info":[{"award-number":["51835007"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52205572"],"award-info":[{"award-number":["52205572"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52127810"],"award-info":[{"award-number":["52127810"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/tie.2023.3294628","type":"journal-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T17:31:03Z","timestamp":1689960663000},"page":"6356-6365","source":"Crossref","is-referenced-by-count":9,"title":["Study on Dynamic and Accurate 6-DOF Measurement System and Approach"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1416-6629","authenticated-orcid":false,"given":"Ruikai","family":"Xin","sequence":"first","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9999-9536","authenticated-orcid":false,"given":"Jiarui","family":"Lin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2490-0578","authenticated-orcid":false,"given":"Shendong","family":"Shi","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2330-1338","authenticated-orcid":false,"given":"Jigui","family":"Zhu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.05.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s16122097"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110426"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2015.12.001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.08.021"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaa215"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2015.7346756"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/12\/125103"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.01.017"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101908"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-8155-7_243"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1177\/0142331214568236"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/s16020153"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/machines9100241"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108834"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2946557"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3788\/lop55.011202"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112052"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2967671"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/581909"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2013.04.015"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMU49871.2020.9243507"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1017\/S0373463315001034"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.34.001810"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa7275"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1177\/0954410014545181"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/PBRA017E"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/qj.2728"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3031532"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10416960\/10189875.pdf?arnumber=10189875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T13:43:36Z","timestamp":1706795016000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10189875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":29,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3294628","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}