{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T09:56:38Z","timestamp":1785578198579,"version":"3.56.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2031207"],"award-info":[{"award-number":["U2031207"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key R&D Program of China","award":["2022YFA1603002"],"award-info":[{"award-number":["2022YFA1603002"]}]},{"name":"CAS","award":["XDC07040200"],"award-info":[{"award-number":["XDC07040200"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,7]]},"DOI":"10.1109\/tie.2023.3306396","type":"journal-article","created":{"date-parts":[[2023,8,31]],"date-time":"2023-08-31T17:36:19Z","timestamp":1693503379000},"page":"8047-8057","source":"Crossref","is-referenced-by-count":4,"title":["IDM-Assisted Capacitive Displacement Sensor for Large-Range, High-Precision Positioning Systems"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9069-3925","authenticated-orcid":false,"given":"Kai","family":"Fan","sequence":"first","affiliation":[{"name":"Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-0337-6269","authenticated-orcid":false,"given":"Ruiqi","family":"Shi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8944-2686","authenticated-orcid":false,"given":"Zhihua","family":"Feng","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/mcs.2007.914688"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s43586-021-00033-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.672917"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2011.2106797"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1166\/jnn.2016.11045"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/oe.417462"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/ao.57.009455"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2016.2521681"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.05.027"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2012.10.016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/32\/1\/019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1147\/rd.255.0483"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2019.2927270"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tvt.2019.2956167"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2977716"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.2183158"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2011.2178678"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.5194\/ms-6-95-2015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665x\/ac1906"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.06.014"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/admt.201900716"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2950838"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1142\/s2010135x12300010"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2007.01.004"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10498107\/10236899.pdf?arnumber=10236899","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,15]],"date-time":"2024-04-15T17:33:51Z","timestamp":1713202431000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10236899\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7]]},"references-count":24,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3306396","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7]]}}}