{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T15:55:18Z","timestamp":1775663718775,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52372359"],"award-info":[{"award-number":["52372359"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","award":["20ZR1461100"],"award-info":[{"award-number":["20ZR1461100"]}],"id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M712397"],"award-info":[{"award-number":["2022M712397"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,7]]},"DOI":"10.1109\/tie.2023.3310035","type":"journal-article","created":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T18:06:23Z","timestamp":1694455583000},"page":"7180-7189","source":"Crossref","is-referenced-by-count":20,"title":["Finite-Control-Set Model-Predictive Control With Data-Driven Switching Frequency Control for Single-Phase Three-Level NPC Rectifiers"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8651-8748","authenticated-orcid":false,"given":"Xu","family":"Zhang","sequence":"first","affiliation":[{"name":"Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6772-0756","authenticated-orcid":false,"given":"Zhixun","family":"Ma","sequence":"additional","affiliation":[{"name":"Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-8234-5938","authenticated-orcid":false,"given":"Haichuan","family":"Niu","sequence":"additional","affiliation":[{"name":"Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-7145-706X","authenticated-orcid":false,"given":"Jian","family":"Huang","sequence":"additional","affiliation":[{"name":"Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6583-4896","authenticated-orcid":false,"given":"Guobin","family":"Lin","sequence":"additional","affiliation":[{"name":"Tongji University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2594227"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IFEEC.2015.7361476"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2690343"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2780160"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2516959"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2400924"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2011.5744646"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036637"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/63.867678"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.1997.648951"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3121589"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.0356"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2681938"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.909728"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2319826"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2019.8785305"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2010.0253"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2599478"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2017.8216779"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2625238"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2815035"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7310124"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2708003"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777385"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/PEDSTC.2017.7910386"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/PowerEng.2013.6635630"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2010.5524333"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2008.4597864"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2013.2291792"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2009.5192352"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2257806"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2931198"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10498108\/10246794.pdf?arnumber=10246794","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,15]],"date-time":"2024-04-15T17:35:35Z","timestamp":1713202535000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10246794\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7]]},"references-count":33,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3310035","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7]]}}}