{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T05:32:19Z","timestamp":1782279139082,"version":"3.54.5"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2020M671499"],"award-info":[{"award-number":["2020M671499"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012489","name":"Joint Project of Industry-University-Research of Jiangsu Province","doi-asserted-by":"publisher","award":["BY2022632"],"award-info":[{"award-number":["BY2022632"]}],"id":[{"id":"10.13039\/501100012489","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,7]]},"DOI":"10.1109\/tie.2023.3312428","type":"journal-article","created":{"date-parts":[[2023,9,19]],"date-time":"2023-09-19T18:01:27Z","timestamp":1695146487000},"page":"6753-6763","source":"Crossref","is-referenced-by-count":23,"title":["Open-Circuit Fault Diagnosis Strategy for Novel DFPMM Drive Based on Fuzzy Logic"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4109-2688","authenticated-orcid":false,"given":"Xuefeng","family":"Jiang","sequence":"first","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8145-3382","authenticated-orcid":false,"given":"Jingyu","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4186-8028","authenticated-orcid":false,"given":"Kaiwen","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-5101-2451","authenticated-orcid":false,"given":"Shirui","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-7945-8480","authenticated-orcid":false,"given":"Zhijian","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-3416-5669","authenticated-orcid":false,"given":"Jiazheng","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2833023"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878131"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2457775"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3204414"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944066"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3135039"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3076509"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3223411"},{"key":"ref9","first-page":"2","article-title":"A diagnostic method for on-line fault detection and localization in VSI-fed AC drives","author":"Abramik","year":"2003","journal-title":"Proc. Eur. Conf. Power Electron. Appl."},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2023640"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WEMDCD.2013.6525187"},{"key":"ref12","first-page":"127","article-title":"Fault diagnosis of PMSM drive system based on normalized current amplitude","volume-title":"Proc. IEEE 45th Annu. Conf. Ind. Electron.","author":"Li"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347541"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2776939"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3061448"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876400"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3011450"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2616398"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962407"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s21124024"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2608842"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3000109"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2875718"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2930592"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.911951"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2015.2500023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674629"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2019.2933787"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/pel2.12098"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2814615"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3125026"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907500"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2018.2819627"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2899168"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3236031"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10498108\/10255292.pdf?arnumber=10255292","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,15]],"date-time":"2024-04-15T17:35:46Z","timestamp":1713202546000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10255292\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7]]},"references-count":35,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3312428","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7]]}}}