{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T22:12:20Z","timestamp":1773871940899,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075193"],"award-info":[{"award-number":["52075193"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52275112"],"award-info":[{"award-number":["52275112"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key R&D Program of China","award":["2020YFB2007601"],"award-info":[{"award-number":["2020YFB2007601"]}]},{"name":"National Key R&D Program of China","award":["2020YFB2007300"],"award-info":[{"award-number":["2020YFB2007300"]}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M711250"],"award-info":[{"award-number":["2022M711250"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/tie.2023.3319710","type":"journal-article","created":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T17:45:24Z","timestamp":1696527924000},"page":"9394-9404","source":"Crossref","is-referenced-by-count":14,"title":["Inverse Design Method of Magnetic Springs With Customized Force\u2013Displacement Relationship Over a Wide Range"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0148-7717","authenticated-orcid":false,"given":"Rui","family":"Zhou","sequence":"first","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4088-8775","authenticated-orcid":false,"given":"Zhiwei","family":"Huang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-9049-3279","authenticated-orcid":false,"given":"Hui","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4237-2713","authenticated-orcid":false,"given":"Jiulin","family":"Wu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4302-4998","authenticated-orcid":false,"given":"Jixing","family":"Che","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5735-3438","authenticated-orcid":false,"given":"Xuedong","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5261-7374","authenticated-orcid":false,"given":"Wei","family":"Jiang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2008.01.046"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2009.04.015"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2014.02.009"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2020.3006619"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2934056"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2014.2322380"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2924858"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3183365"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-022-2124-5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmecsci.2020.105695"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2022.3189406"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.110003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2022.116585"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tmech.2019.2898405"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2016.11.026"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.09.040"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.03.041"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2020.115449"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2015.09.019"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2018.02.046"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.12.028"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmecsci.2021.106980"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-022-2121-7"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.110014"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110387"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108507"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-019-05144-w"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2014.07.077"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2021.114246"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2017.2698080"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2017.2759099"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tro.2019.2892811"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2009.02.128"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2004.09.004"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2009.2025047"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10505837\/10272380.pdf?arnumber=10272380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:21:40Z","timestamp":1734376900000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10272380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":35,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3319710","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}