{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T18:32:22Z","timestamp":1770748342619,"version":"3.50.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52007049"],"award-info":[{"award-number":["52007049"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008238","name":"Bureau of Science and Technology of Hebei Province","doi-asserted-by":"publisher","award":["E2021202046"],"award-info":[{"award-number":["E2021202046"]}],"id":[{"id":"10.13039\/501100008238","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/tie.2023.3327529","type":"journal-article","created":{"date-parts":[[2023,11,9]],"date-time":"2023-11-09T18:56:44Z","timestamp":1699556204000},"page":"9747-9756","source":"Crossref","is-referenced-by-count":4,"title":["An Online Condition Monitoring Method for Series-Connected Capacitors Using Auxiliary Discharging Network"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6489-0135","authenticated-orcid":false,"given":"Jianliang","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-9932-836X","authenticated-orcid":false,"given":"Jiawei","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7257-5191","authenticated-orcid":false,"given":"Jianlong","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7229-988X","authenticated-orcid":false,"given":"Zhen","family":"Xin","sequence":"additional","affiliation":[{"name":"Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5404-3140","authenticated-orcid":false,"given":"Huai","family":"Wang","sequence":"additional","affiliation":[{"name":"Aalborg University, Aalborg &#x00D8;st, Denmark"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2252958"},{"key":"ref2","article-title":"Aluminum Electrolytic Capacitors-Precautions and Guidelines","year":"2005"},{"key":"ref3","article-title":"General specification for capacitors","year":"2008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3023469"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.07.110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-1638(199601)12:1<43::AID-QRE981>3.0.CO;2-O"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5637333"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2904551"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.2002220"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2835393"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3128021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IFEEC.2017.7992442"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PowerEng.2015.7266382"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IPEMC.2016.7512885"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096961"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2836923"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2951859"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2945943"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3177543"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2383436"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2222333"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2890617"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2957027"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2964068"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2691048"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2550527"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3153825"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2012.6334580"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175486"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME.2011.6102687"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.2002220"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10505837\/10314041.pdf?arnumber=10314041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:22:19Z","timestamp":1734376939000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10314041\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":31,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3327529","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}