{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T15:10:06Z","timestamp":1783177806492,"version":"3.54.6"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61873348"],"award-info":[{"award-number":["61873348"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Japan Society for the Promotion of Science (JSPS) KAKENHI","award":["22H03998"],"award-info":[{"award-number":["22H03998"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/tie.2023.3329201","type":"journal-article","created":{"date-parts":[[2023,12,4]],"date-time":"2023-12-04T18:54:20Z","timestamp":1701716060000},"page":"11283-11293","source":"Crossref","is-referenced-by-count":8,"title":["Improving Equivalent-Input-Disturbance Approach via Modifying a Disturbance-Estimation Algorithm"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3570-6172","authenticated-orcid":false,"given":"Xiang","family":"Yin","sequence":"first","affiliation":[{"name":"School of Electrical and Control Engineering, North China University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2785-5215","authenticated-orcid":false,"given":"Yuntao","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Electrical and Control Engineering, North China University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3165-5045","authenticated-orcid":false,"given":"Jinhua","family":"She","sequence":"additional","affiliation":[{"name":"School of Engineering, Tokyo University of Technology, Tokyo, Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4807-7739","authenticated-orcid":false,"given":"Qicheng","family":"Mei","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering and New Energy, China Three Gorges University, Yichang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8136-5153","authenticated-orcid":false,"given":"Lan","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2014.03.003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478397"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2020.125432"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2971056"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2021.126839"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.10.006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2014.2338554"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1987.350923"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011621"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.905976"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2021.08.032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2021.3053597"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2021.08.010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.05.030"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3229713"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1201\/b10382"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10547605\/10339401.pdf?arnumber=10339401","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T04:54:08Z","timestamp":1717649648000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10339401\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":16,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3329201","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}