{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T02:16:08Z","timestamp":1781835368337,"version":"3.54.5"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207045"],"award-info":[{"award-number":["52207045"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"S&amp;T Program of Hebei","award":["225676163GH"],"award-info":[{"award-number":["225676163GH"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/tie.2023.3333056","type":"journal-article","created":{"date-parts":[[2023,11,28]],"date-time":"2023-11-28T19:13:57Z","timestamp":1701198837000},"page":"10162-10172","source":"Crossref","is-referenced-by-count":37,"title":["Virtual Current Compensation-Based Quasi-Sinusoidal-Wave Excitation Scheme for Switched Reluctance Motor Drives"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0087-603X","authenticated-orcid":false,"given":"Qingguo","family":"Sun","sequence":"first","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-8089-9201","authenticated-orcid":false,"given":"Guangyu","family":"Lyu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5140-5997","authenticated-orcid":false,"given":"Xu","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2465-647X","authenticated-orcid":false,"given":"Feng","family":"Niu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7563-7415","authenticated-orcid":false,"given":"Chun","family":"Gan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3078400"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3190895"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3116569"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3108707"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2022.3225228"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2898600"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2618342"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2023568"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2740824"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2006.295906"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/63.761700"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2846539"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2633477"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3037987"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0270"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2710137"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2975481"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2005.853381"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050349"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2012.6237170"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2870355"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3183001"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3020026"},{"key":"ref24","first-page":"1","article-title":"Torque improvement of three-phases full bridge converter based switched reluctance motor with DC assisted winding","volume-title":"Proc. 15th Int. Conf. Elect. Mach. Syst.","author":"Tungpimolrut"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICELMACH.2014.6960294"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2014.6953579"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2019.0548"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2975121"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3192600"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3139174"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3253961"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6647200"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7855529"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10547602\/10329445.pdf?arnumber=10329445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T04:53:08Z","timestamp":1717649588000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10329445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":33,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3333056","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}